TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
SPECIFICATION
Electron Gun: Heated tungsten filament cathode Electron Optics: Wide Field Optics™ Technology with Intermediate Lens™ and In-Flight Beam Tracing™ Resolution: High Vacuum Mode: 3 nm at 30 keV 8 nm at 3 keV Low Vacuum Mode: 3.5 nm at 30 keV with BSE detector* 3.5 nm at 30 keV with LVSTD detector*
BBCE projekta galvenais uzdevums ir izveidot Baltijas Biomateriālu ekselences centru progresīvai biomateriālu pētniecībai, kas balstīts uz ilgtermiņa stratēģisku sadarbību starp Šveices AO Research Institute Davos, Vācijas Fridriha-Aleksandra Erlangenas-Nirnbergas universitātes Biomateriālu centru, RTU Rūdolfa Cimdiņa Rīgas Biomateriālu inovāciju un attīstības centru, Latvijas Organiskās sintēzes institūtu un Rīgas Stradiņa universitāti.